Contribution to modeling of parasitic couplings for predicting EMC behavior of electrical machines

Authors : J. I. Ramos ; J-M. Dienot ; P-E. Vidal ; C. Viguier ; B. Nogarède

Date of Conference : 2-5 Sept. 2014
Conference Location : Berlin, Germany
Date Added to IEEE Xplore : 20 November 2014
Publisher : IEEE


The characterization of parasitic couplings contributing to mechatronic assemblies' wide band Electromagnetic Compatibility (EMC) behavior is complex but increasingly essential for meeting needed performance and regulations. This article presents a comparative study of analytical and numerical approaches to determine the capacitive couplings in wound structures as an effort to develop a comprehensive approach to predict and prevent undesired couplings. The approach is based on physical and structural parameters analysis instead of behavioral characterization, allowing the use of predictive tools in the early design stage of mechatronic systems. The analytical model presented is compared to simulation methods applied to a three-layer inductor. Calculations converge to similar results. In the last part of the work, an experimental measurement of stray capacitance is done on an actual stator winding and compared to the analytical predictions of parasitic capacitances.

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